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Results 1 to 25 of 274

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THz pulse shaping and improved optical-to-THz conversion efficiency using a binary phase maskROPAGNOL, Xavier; MORANDOTTI, Roberto; OZAKI, Tsuneyuki et al.Optics letters. 2011, Vol 36, Num 14, pp 2662-2664, issn 0146-9592, 3 p.Article

Monolithic double-grating phase mask for large-period highly coherent grating printingBOURGIN, Y; BAKKALI, S; JOURLIN, Y et al.Optics letters. 2009, Vol 34, Num 24, pp 3800-3802, issn 0146-9592, 3 p.Article

Flexible chirp control using the linearly inherent chirped phase mask with the equivalent chirp designLI XIA; SHUM, Ping; CHAO LU et al.Optics communications. 2006, Vol 261, Num 1, pp 56-59, issn 0030-4018, 4 p.Article

Real-time increase in depth of field of an uncooled thermal camera using several phase-mask technologiesDIAZ, Frederic; LAURE LEE, Mane-Si; REJEAUNIER, Xavier et al.Optics letters. 2011, Vol 36, Num 3, pp 418-420, issn 0146-9592, 3 p.Article

Sub-nanometer metrology of chirped phase masks by optical MoiréBARNIER, F; DYER, P. E; SNELLING, H. V et al.Optics communications. 1999, Vol 170, Num 4-6, pp 175-179, issn 0030-4018Article

Analysis on the laser beam pointing instability induced fringe shift and contrast dilution from different interferometers used for writing fiber Bragg gratingMAHAKUD, R; PRAKASH, O; DIXIT, S. K et al.Optics communications. 2009, Vol 282, Num 11, pp 2204-2211, issn 0030-4018, 8 p.Article

Random phase mask in a filamentation regime: application to the localization of point sourcesDE LA BARRIERE, Florence; DRUART, Guillaume; GUERINEAU, Nicolas et al.Optics letters. 2011, Vol 36, Num 5, pp 684-686, issn 0146-9592, 3 p.Article

Optimized sinusoidal phase mask to extend the depth of field of an incoherent imaging systemHUI ZHAO; YINGCAI LI.Optics letters. 2010, Vol 35, Num 2, pp 267-269, issn 0146-9592, 3 p.Article

Aberration-induced intensity imbalance of alternating phase-shifting mask in lithographic imagingBO PENG; XIANGZHAO WANG; ZICHENG QIU et al.Optics letters. 2010, Vol 35, Num 9, pp 1404-1406, issn 0146-9592, 3 p.Article

Characterization of the scattering effect of complex mask geometries with surface roughnessRAHIMIL, Z; ERDMANN, A; PFLAUM, C et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7717, issn 0277-786X, isbn 978-0-8194-8190-0 0-8194-8190-4, 1Vol, 771709.1-771709.12Conference Paper

Modeling resist response in holographic formation of three-dimension photonic crystal templatesABOLGHASEMI, Ladan E; CHANDA, Debashis; HERMAN, Peter R et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 63432Y.1-63432Y.8, issn 0277-786X, isbn 0-8194-6428-7Conference Paper

Phase mask selection in wavefront coding systems: A design approachCARLES, Guillem; CARNICER, Artur; BOSCH, Salvador et al.Optics and lasers in engineering. 2010, Vol 48, Num 7-8, pp 779-785, issn 0143-8166, 7 p.Article

Variations of the growth of harmonic reflections in fiber Bragg gratings fabricated using phase masksROLLINSON, Claire M; WADE, Scott A; KOUSKOUSIS, Betty P et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2012, Vol 29, Num 7, pp 1259-1268, issn 1084-7529, 10 p.Article

Effect of a spoke surface error on a phase mask in a computational imaging systemCHANG, Chuan-Chung; LEE, Cheng-Chung.Journal of modern optics (Print). 2010, Vol 57, Num 4, pp 316-324, issn 0950-0340, 9 p.Article

Experimental advances in phase mask coronagraphyN'DLAYE, Mamadou; DOHLEN, Kjetil; CUEVAS, Salvador et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7739, issn 0277-786X, isbn 978-0-8194-8229-7 0-8194-8229-3, 2Vol, 77391Z.1-77391Z.12, 2Conference Paper

Optimized free-form phase mask for extension of depth of field in wavefront-coded imagingTAKAHASHI, Yasuhisa; KOMATSU, Shinichi.Optics letters. 2008, Vol 33, Num 13, pp 1515-1517, issn 0146-9592, 3 p.Article

Ultra narrow flat-top filter based on multiple equivalent phase shiftsFEI WANG; XIHUA ZOU; ZUOWEI YIN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7134, issn 0277-786X, isbn 978-0-8194-7374-5 0-8194-7374-X, 713433.1-713433.7, 2Conference Paper

Enhancement of image hiding by exchanging two phase masksYAN ZHANG; BO WANG; ZHILI DONG et al.Journal of optics. A, Pure and applied optics (Print). 2009, Vol 11, Num 12, issn 1464-4258, 125406.1-125406.4Article

Improved logarithmic phase mask to extend the depth of field of an incoherent imaging systemHUI ZHAO; QI LI; HUAJUN FENG et al.Optics letters. 2008, Vol 33, Num 11, pp 1171-1173, issn 0146-9592, 3 p.Article

Effective algorithm for random mask generation used in secured optical data encryption and communicationYUEXIN LIU; METZNER, John J; RUYAN GUO et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 59111G.1-59111G.9, issn 0277-786X, isbn 0-8194-5916-X, 1VolConference Paper

Generation of pure two-beam interference grating structures in an optical fiber with a femtosecond infrared source and a phase maskSMELSER, C. W; GROBNIC, D; MIHAILOV, S. J et al.Optics letters. 2004, Vol 29, Num 15, pp 1730-1732, issn 0146-9592, 3 p.Article

Analog proximity-photolithography with mask aligners for the manufacturing of micro-optical elementsERDMANN, T; CUMME, M; WITTIG, L.-C et al.SPIE proceedings series. 2003, pp 132-139, isbn 0-8194-5056-1, 8 p.Conference Paper

Rational phase mask to extend the depth of field in optical-digital hybrid imaging systemsFENG ZHOU; GUANGWEI LI; HAITAO ZHANG et al.Optics letters. 2009, Vol 34, Num 3, pp 380-382, issn 0146-9592, 3 p.Article

The analysis of ray aberration of arbitrary phase mask in the wavefront coding systemWEIWEI HUANG; ZI YE; WENZI ZHANG et al.Optics communications. 2008, Vol 281, Num 18, pp 4577-4580, issn 0030-4018, 4 p.Article

Continuous writing technique of long gratings for metrological applicationsGARNET, Emilie; JOURLIN, Yves; REYNAUD, Stéphanie et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 618808.1-618808.6, issn 0277-786X, isbn 0-8194-6244-6, 1VolConference Paper

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